Webinar: Improving reliability of NAND storage using trace tools


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LAUTERBACH and WESTERN DIGITAL are pleased to invite you to our free Webinar
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Webinar: Improving reliability of NAND storage using trace tools

 

LAUTERBACH and WESTERN DIGITAL are pleased to invite you to our free Webinar


Title

Improving reliability of NAND storage using trace tools

Who is this webinar for? It is intended for software developers working on embedded systems where reliability and lifetime of flash storage are important considerations.

This seminar will illustrate an advanced technique for the workload analysis of NAND managed flash memories, in order to estimate their premature aging and identify how to optimize their use to solve the problem.

Abstract

The widespread use of NAND-based storage devices in many of today’s applications raises the issue of wear-out resulting from write intensive usage. When they are used in safety-critical systems, storage workload analysis becomes a vital task when qualifying the system with respect to its longevity.  Microprocessor trace tools allow for an efficient way of logging target activity. This technology can be adapted for life-time estimation with minimum, or zero, application overhead in order to improve reliability of the overall system. In this webinar, we will explain and show with a live demo how to analyze storage activity using trace, estimate life time and thereby improve reliability of the whole system.

You will learn:
  • The impact of wear-out on the life expectancy of NAND-based storage devices
  • How to set up microprocessor trace for a storage device with a minimum amount of, or even no code instrumentation at all
  • Estimate storage life time using captured microprocessor trace data
 

Date, Time and Registration


The webinar is an interactive free on-line seminar which you can watch in audio-video with your computer, connected to the internet. The presentation will be held in English and will last about 1 hour. It will include a live demonstration to showcase the logging and analysis techniques described.

Thursday SEPTEMBER 29th, 2022

  • 1st session 9:00 AM CEST, (Region: Asia and Europe) Register HERE

  • 2nd session 5:00 PM CEST, (Region: US and Europe) Register HERE

Note: the webinar will be held twice at two different times, each participant can register for the first session, or the second or both.

Agenda

  • Considerations using managed NAND devices
  • Logging memory accesses
  • Live Demo
  • Analysis of memory access
  • Comparison with software methods
  • Conclusion
  • Q&A
Organizers: Markus Herdin and Maurizio Menegotto from Lauterbach
Speakers: Rudi Dienstbeck and Marco Ferrario from Lauterbach, Matteo Zammattio from Western Digital.

Participants will be able to ask questions and get answers from the speakers.



 

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Last generated/modified: 08-Sep-2022