TeakLite-III Trace
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TeakLite-III Trace
  Highlights
Support for CEVA-TeakLite-III Real-Time Trace
Universal preprocessor hardware AutoFocus II
Selfcalibration of sampling points
Up to 32 data bits
Instruction trace, cycle-accurate tracing possible
Data address and data value trace
Multi-core tracing e.g. with ARM-ETM
Up to 8 GByte trace memory
Long-time trace
Trace-based debugging (CTS)
Performance analysis
Code coverage




 

Self-Calibration


Lauterbach′s TRACE32 software provides a push-button-solution for optimal hardware configuration including a trace port test. Just push the AutoFocus button and a small test programm is downloaded to the target causing worst case test patterns on the trace port. Trace probes with AUTOFOCUS are capable of recognizing data eyes, adjusting reference voltage such that clocks are stable and data channels have broad data eyes. Last not least optimal sampling points are calculated and setup for every data channel.
AUTOFOCUS Self Calibration
  • Successfully deployed for trace port data rates in excess of 600 Mbit/s per trace channel
  • Up to 40 trace channels
  • Up to 16 Gbit/s total bandwidth
  • Data eye recognition capability
  • 78 ps time resolution
  • Automatic adjustment of termination voltage
  • Automatic adjustment of threshold voltage separately for all clock and data channels
  • Automatic adjustment of clock delay
  • Automatic adjustment of data delay for every single channel
  • Automatic trace port test
 

Trace Display


TRACE32 offers a comprehensive trace display and analysis.



 

Standard Trace Features
Trace-based Debugging (CTS)
  • Allows re-debuggging of a traced program section
  • Provides forward and backward debugging capabilities
  • High-level language trace display including all local variables
  • Timing and function nesting display
  • Has the ability to fill most trace gaps caused by the limited bandwidth of trace port
Trace-based Profiling
  • Detailed analysis of function run-times
  • Detailed analysis of task run-times and state
  • Graphical analysis of variable values over the time
  • Analysis of the time interval of a single event (e.g. Interrupt)
  • Analysis of the time interval between 2 defined events
Sample-based Profiling
  • Long-time performance analysis for functions
  • Long-time performance analysis for tasks
  • Long-time analysis of the contents of a variable or memory location and more
Trace-based Code Coverage
  • Provides all metrics for functional safety
  • For standard trace protocols TRACE32 Code Coverage gets by with no or very little instrumentation, full instrumentation as fallback
  • Suitable for long-term testing
  • Automated report generation in multiple exchange formats
  • TRACE32 Trace-Based Code Coverage is included in the scope of delivery of all TRACE32 Debug & Trace Tools at no additional cost
 

Adaption Methods
Adaptation for TeakLite-III Preprocessor

 

FLEX Adapters
FLEX Adapter
  • Highly Flexible Adapters
  • For Debuggers and ICD Trace
  • High Signal Quality
  • Adapted Impedance
  • MICTOR
  • 100 MIL
  • SAMTEC
  • YAMAICHI





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The information presented is intended to give overview information only.
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Last generated/modified: 21-Feb-2023