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Up to 8 GByte trace memory
up to 1024 MFrames
Target voltage 0.4 .. 5.2 V
20/5 ns time stamp
Full support for trigger and filter features
Recontruction of trace gaps in the case of an overflow of the internal FIFO
Performance analysis
Function and task run-time measurement
Code coverage
Discrete instruction and data trace

Max. Operation Frequency
Technical Support



The PowerTrace samples all trace port lines up to a speed of 500 MHz into the trace buffer. The maximum size of the trace buffer is 1024 MFrames (1 frame per clock).

The connection to the target is done by standardized adapters defined by manufacturer. The system can run on PCs or any workstation.


NIOS-II Trace Features For Advanced Debugging

Program Flow Trace

Data Trace


Trace Filter and Trigger
  • Sample only the specified event
  • Sample the complete program flow and the specified data event
  • Switch the sampling to the trace buffer on/off after a specified event occurred
Trace-based Debugging (CTS)
  • Allows re-debuggging of a traced program section
  • Provides forward and backward debugging capabilities
  • High-level language trace display including all local variables
  • Timing and function nesting display
  • Has the ability to fill most trace gaps caused by the limited bandwidth of trace port
  • Fills in missing code
  • Direct branch reconstruction
  • Indirect branch reconstuction with CTS
  • Memory and Register values from CTS
Energy Profiling
  • Find the program part causing the highest energy consumption
  • Locate unexpected power peaks
  • Check if power-saving modes are used efficiently
  • Current and voltage measurement with TRACE32 Mixed Signal Probe or TRACE32 Analog Probe
  • Time correlation with TRACE32 trace tools PowerTrace, CombiProbe, MicroTrace
  • Energy statistics on function and task level
RTOS Support

NIOS-II Trace Features For Runtime Analysis

Trace-based Profiling
  • Detailed analysis of function run-times
  • Detailed analysis of task run-times and state
  • Graphical analysis of variable values over the time
  • Analysis of the time interval of a single event (e.g. Interrupt)
  • Analysis of the time interval between 2 defined events
Sample-based Profiling
  • Long-time performance analysis for functions
  • Long-time performance analysis for tasks
  • Long-time analysis of the contents of a variable or memory location and more

NIOS-II Trace Features For Quality Assurance And Optimizing

Trace-based Code Coverage
  • Real-time code coverage without instrumentation
  • Suitable for long-term testing
  • Support for all common code coverage metrics
  • Automated report generation
  • Full support of multicore chips
Trace-based Cache Analysis
  • Basic support for all microcontrollers
  • Advanced support for ARM architecture
  • Optimize instruction and data cache usage
  • Find bus transfer bottlenecks
  • Verify effects of code optimisation
  • Simulate effects of different cache sizes
  • Various graphical and numerical displays


Adaptation for Nios II


Application Note

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Last generated/modified: 19-Oct-2021