NIOS II Trace


The embedded tools company


NIOS2

NIOS II Trace
  Highlights
Up to 8 GByte trace memory
up to 1024 MFrames
Target voltage 0.4 .. 5.2 V
20/5 ns time stamp
Full support for trigger and filter features
Recontruction of trace gaps in the case of an overflow of the internal FIFO
Performance analysis
Function and task run-time measurement
Code coverage
Discrete instruction and data trace


Freq
Max. Operation Frequency
Support
Technical Support



 

TRACE EXTENSION FOR NIOS-II


The PowerTrace samples all trace port lines up to a speed of 500 MHz into the trace buffer. The maximum size of the trace buffer is 1024 MFrames (1 frame per clock).

The connection to the target is done by standardized adapters defined by manufacturer. The system can run on PCs or any workstation.

 

NIOS-II Trace Features For Advanced Debugging


Program Flow Trace

Data Trace

Timestamp

Trace Filter and Trigger
  • Sample only the specified event
  • Sample the complete program flow and the specified data event
  • Switch the sampling to the trace buffer on/off after a specified event occurred
Trace-based Debugging (CTS)
  • Allows re-debuggging of a traced program section
  • Provides forward and backward debugging capabilities
  • High-level language trace display including all local variables
  • Timing and function nesting display
  • Has the ability to fill most trace gaps caused by the limited bandwidth of trace port
SmartTrace
  • Fills in missing code
  • Direct branch reconstruction
  • Indirect branch reconstuction with CTS
  • Memory and Register values from CTS
Energy Profiling
  • Find the program part causing the highest energy consumption
  • Locate unexpected power peaks
  • Check if power-saving modes are used efficiently
  • Current and voltage measurement with TRACE32 Mixed Signal Probe or TRACE32 Analog Probe
  • Time correlation with TRACE32 trace tools PowerTrace, CombiProbe, MicroTrace
  • Energy statistics on function and task level
RTOS
RTOS Support
 

NIOS-II Trace Features For Runtime Analysis


Trace-based Profiling
  • Detailed analysis of function run-times
  • Detailed analysis of task run-times and state
  • Graphical analysis of variable values over the time
  • Analysis of the time interval of a single event (e.g. Interrupt)
  • Analysis of the time interval between 2 defined events
Sample-based Profiling
  • Long-time performance analysis for functions
  • Long-time performance analysis for tasks
  • Long-time analysis of the contents of a variable or memory location and more
 

NIOS-II Trace Features For Quality Assurance And Optimizing


Trace-based Code Coverage
  • Real-time code coverage without instrumentation
  • Suitable for long-term testing
  • Support for all common code coverage metrics
  • Automated report generation
  • Full support of multicore chips
Trace-based Cache Analysis
  • Basic support for all microcontrollers
  • Advanced support for ARM architecture
  • Optimize instruction and data cache usage
  • Find bus transfer bottlenecks
  • Verify effects of code optimisation
  • Simulate effects of different cache sizes
  • Various graphical and numerical displays
 

Connector


Adaptation for Nios II

 

Application Note






Copyright © 2021 Lauterbach GmbH, Altlaufstr.40, 85635 Höhenkirchen-Siegertsbrunn, Germany   Impressum     Privacy Policy
The information presented is intended to give overview information only.
Changes and technical enhancements or modifications can be made without notice. Report Errors
Last generated/modified: 25-Feb-2021