TRACE32® NIOS II Trace

NIOS2

Highlights

	up to 4 GByte trace memory
	up to 512 MFrames
	Target voltage 0.4 .. 5.2 V
	20/5 ns time stamp
	Full support for trigger and filter features
	Recontruction of trace gaps in the case of an overflow of the internal FIFO
	Performance analysis
	Function and task run-time measurement
	Code coverage
	Discrete instruction and data trace
	Support for NIOS-II

			Max. Operation Frequency	Operation Voltage	Frequently Asked Questions	Product Information	Technical Support
Debugger for NIOS-II PowerTrace [www.altera.com] Altera NIOS Site

TRACE EXTENSION FOR NIOS-II

The PowerTrace samples all trace port lines up to a speed of 500 MHz into the trace buffer. The maximum size of the trace buffer is 64/128 MFrames (1 frame per clock).

The connection to the target is done by standardized adapters defined by manufacturer. The system can run on PCs or any workstation.

NIOS-II Trace Features For Advanced Debugging

Program Flow Trace

Data Trace

Timestamp

Trace Filter and Trigger

Sample only the specified event
Sample the complete program flow and the specified data event
Switch the sampling to the trace buffer on/off after a specified event occurred

Trace-based Debugging (CTS)

Allows re-debuggging of a traced program section
Provides forward and backward debugging capabilities
High-level language trace display including all local variables
Timing and function nesting display
Has the ability to fill most trace gaps caused by the limited bandwidth of trace port

SmartTrace

Fills in missing code
Direct branch reconstruction
Indirect branch reconstuction with CTS
Memory and Register values from CTS

Energy Profiling

Realtime measurement of 3 current and 4 voltage lines
Realtime trigger on current, voltage and power
Time correlation with other TRACE32 tracetools
Energy statistics on function and task level
Fully integrated in the TRACE32 user interface

RTOS Support

NIOS-II Trace Features For Runtime Analysis

Trace-based Profiling

Detailed analysis of function run-times
Detailed analysis of task run-times and state
Graphical analysis of variable values over the time
Analysis of the time interval of a single event (e.g. Interrupt)
Analysis of the time interval between 2 defined events

Sample-based Profiling

Long-time performance analysis for functions
Long-time performance analysis for tasks
Long-time analysis of the contents of a variable or memory location and more

NIOS-II Trace Features For Quality Assurance And Optimizing

Trace-based Code Coverage

Real-time code coverage without instrumentation
Suitable for long-term testing
Support for all common code coverage metrics
Automated report generation
Full support of multicore chips

Trace-based Cache Analysis

Basic support for all microcontrollers
Advanced support for ARM architecture
Optimize instruction and data cache usage
Find bus transfer bottlenecks
Verify effects of code optimisation
Simulate effects of different cache sizes
Various graphical and numerical displays

Connector

Adaptation for Nios II

Application Note

Instantiating the Off-Chip Trace NIOS

Buffer Module for Off-Chip Trace Port

Details and Configurations


NIOS_II
	NIOS-II	Altera Corporation

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Last generated/modified: 15-Feb-2019