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up to 4 GByte trace memory
up to 512 MFrames
Target voltage 0.4 .. 5.2 V
20/5 ns time stamp
Full support for trigger and filter features
Recontruction of trace gaps in the case of an overflow of the internal FIFO
Performance analysis
Function and task run-time measurement
Code coverage
Discrete instruction and data trace

Link Freq
Max. Operation Frequency
Technical Support
Debugger for NIOS-II
[]  Altera NIOS Site



The PowerTrace samples all trace port lines up to a speed of 500 MHz into the trace buffer. The maximum size of the trace buffer is 64/128 MFrames (1 frame per clock).

The connection to the target is done by standardized adapters defined by manufacturer. The system can run on PCs or any workstation.


NIOS-II Trace Features For Advanced Debugging

Program Flow Trace

Data Trace


Trace Filter and Trigger
  • Sample only the specified event
  • Sample the complete program flow and the specified data event
  • Switch the sampling to the trace buffer on/off after a specified event occurred
Trace-based Debugging (CTS)
  • Allows re-debuggging of a traced program section
  • Provides forward and backward debugging capabilities
  • High-level language trace display including all local variables
  • Timing and function nesting display
  • Has the ability to fill most trace gaps caused by the limited bandwidth of trace port
  • Fills in missing code
  • Direct branch reconstruction
  • Indirect branch reconstuction with CTS
  • Memory and Register values from CTS
Energy Profiling
  • Realtime measurement of 3 current and 4 voltage lines
  • Realtime trigger on current, voltage and power
  • Time correlation with other TRACE32 tracetools
  • Energy statistics on function and task level
  • Fully integrated in the TRACE32 user interface
RTOS Support

NIOS-II Trace Features For Runtime Analysis

Trace-based Profiling
  • Detailed analysis of function run-times
  • Detailed analysis of task run-times and state
  • Graphical analysis of variable values over the time
  • Analysis of the time interval of a single event (e.g. Interrupt)
  • Analysis of the time interval between 2 defined events
Sample-based Profiling
  • Long-time performance analysis for functions
  • Long-time performance analysis for tasks
  • Long-time analysis of the contents of a variable or memory location and more

NIOS-II Trace Features For Quality Assurance And Optimizing

Trace-based Code Coverage
  • Real-time code coverage without instrumentation
  • Suitable for long-term testing
  • Support for all common code coverage metrics
  • Automated report generation
  • Full support of multicore chips
Trace-based Cache Analysis
  • Basic support for all microcontrollers
  • Advanced support for ARM architecture
  • Optimize instruction and data cache usage
  • Find bus transfer bottlenecks
  • Verify effects of code optimisation
  • Simulate effects of different cache sizes
  • Various graphical and numerical displays


Adaptation for Nios II


Application Note


Details and Configurations

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Last generated/modified: 13-Jan-2021