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Up to 8 GByte trace memory
up to 1024 MFrames
Target voltage 0.4 .. 5.2 V
20/5 ns time stamp
Full support for trigger and filter features
Recontruction of trace gaps in the case of an overflow of the internal FIFO
Performance analysis
Function and task run-time measurement
Code coverage
Discrete instruction and data trace

Technical Support




NIOS-II Trace Features For Advanced Debugging

Program Flow Trace

Data Trace


Trace Filter and Trigger
  • Sample only the specified event
  • Sample the complete program flow and the specified data event
  • Switch the sampling to the trace buffer on/off after a specified event occurred
Trace-based Debugging (CTS)
  • Allows re-debuggging of a traced program section
  • Provides forward and backward debugging capabilities
  • High-level language trace display including all local variables
  • Timing and function nesting display
  • Has the ability to fill most trace gaps caused by the limited bandwidth of trace port
  • Fills in missing code
  • Direct branch reconstruction
  • Indirect branch reconstuction with CTS
  • Memory and Register values from CTS
Energy Profiling
  • Find the program part causing the highest energy consumption
  • Locate unexpected power peaks
  • Check if power-saving modes are used efficiently
  • Current and voltage measurement with TRACE32 Mixed Signal Probe or TRACE32 Analog Probe
  • Time correlation with TRACE32 trace tools PowerTrace, CombiProbe, MicroTrace
  • Energy statistics on function and task level
RTOS Support

NIOS-II Trace Features For Runtime Analysis

Trace-based Profiling
  • Detailed analysis of function run-times
  • Detailed analysis of task run-times and state
  • Graphical analysis of variable values over the time
  • Analysis of the time interval of a single event (e.g. Interrupt)
  • Analysis of the time interval between 2 defined events
Sample-based Profiling
  • Long-time performance analysis for functions
  • Long-time performance analysis for tasks
  • Long-time analysis of the contents of a variable or memory location and more

NIOS-II Trace Features For Quality Assurance And Optimizing

Trace-based Code Coverage
  • Support for all code coverage metrics mandated by functional safety standards
  • Suitable for long-term testing
  • Support for all common code coverage metrics
  • Automated report generation
  • Full support of multicore chips
Trace-based Cache Analysis
  • Basic support for all microcontrollers
  • Advanced support for ARM architecture
  • Optimize instruction and data cache usage
  • Find bus transfer bottlenecks
  • Verify effects of code optimisation
  • Simulate effects of different cache sizes
  • Various graphical and numerical displays


Adaptation for Nios II


Application Note

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The information presented is intended to give overview information only.
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Last generated/modified: 27-Sep-2022