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Live demo of TRACE32® for APM82181 at AppliedMicro´s booth
Visit AppliedMicro´s Booth #2010 at the ESC Silicon Valley 2010
Lauterbach releases advanced debugging support for AppliedMicro´s APM82181. With high speed trace, TRACE32® enables the most advanced features available, including performance analysis, statistical analysis, and Context Tracking. Be sure to check out a personal demo at this year's Embedded Systems Conference.
Lauterbach will be displaying a demo at the Lauterbach table within AppliedMicro´s booth (#2010) at this year's Embedded Systems Conference.
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