NIOS II Trace


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NIOS2

NIOS II Trace
  Highlights
up to 4 GByte trace memory
up to 512 MFrames
Target voltage 0.4 .. 5.2 V
20/5 ns time stamp
Full support for trigger and filter features
Recontruction of trace gaps in the case of an overflow of the internal FIFO
Performance analysis
Function and task run-time measurement
Code coverage
Discrete instruction and data trace
Support for ALTERA NIOS-II


Link Dim
Modules
Adaptions
Dimensions
Freq
Max. Operation Frequency
Volt
Operation Voltage
FAQ
Frequently Asked Questions
Order
Order
Information
Support
Technical Support
Debugger for NIOS-II
PowerTrace
[www.altera.com]  Altera NIOS Site




 
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TRACE EXTENSION FOR NIOS-II


The PowerTrace samples all trace port lines up to a speed of 500 MHz into the trace buffer. The maximum size of the trace buffer is 64/128 MFrames (1 frame per clock).

The connection to the target is done by standardized adapters defined by manufacturer. The system can run on PCs or any workstation.

 
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NIOS-II Trace Features For Advanced Debugging


Program Flow Trace

Data Trace

Timestamp

Trace Filter and Trigger
  • Sample only the specified event
  • Sample the complete program flow and the specified data event
  • Switch the sampling to the trace buffer on/off after a specified event occurred
Trace-based Debugging (CTS)
  • Allows re-debuggging of a traced program section
  • Provides forward and backward debugging capabilities
  • High-level language trace display including all local variables
  • Timing and function nesting display
  • Has the ability to fill most trace gaps caused by the limited bandwidth of trace port
SmartTrace
  • Fills in missing code
  • Direct branch reconstruction
  • Indirect branch reconstuction with CTS
  • Memory and Register values from CTS
Energy Profiling
  • Realtime measurement of 3 current and 4 voltage lines
  • Realtime trigger on current, voltage and power
  • Time correlation with other TRACE32 tracetools
  • Energy statistics on function and task level
  • Fully integrated in the TRACE32 user interface
RTOS
RTOS Support
 
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NIOS-II Trace Features For Runtime Analysis


Trace-based Profiling
  • Detailed analysis of function run-times
  • Detailed analysis of task run-times and state
  • Graphical analysis of variable values over the time
  • Analysis of the time interval of a single event (e.g. Interrupt)
  • Analysis of the time interval between 2 defined events
Sample-based Profiling
  • Long-time performance analysis for functions
  • Long-time performance analysis for tasks
  • Long-time analysis of the contents of a variable or memory location and more
 
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NIOS-II Trace Features For Quality Assurance And Optimizing


Trace-based Code Coverage
  • Real-time code coverage without instrumentation
  • Suitable for long-term testing
  • Analysis for both assembly and source code level
  • Off-line review capabilities
  • Full support of multicore chips
Trace-based Cache Analysis
  • Basic support for all microcontrollers
  • Advanced support for ARM architecture
  • Optimize instruction and data cache usage
  • Find bus transfer bottlenecks
  • Verify effects of code optimisation
  • Simulate effects of different cache sizes
  • Various graphical and numerical displays
 
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Connector


Adaption for Nios II

 
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Application Note


 
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Details and Configurations


 
NIOS_II
NIOS-IIAltera Corporation




Copyright © 2016 Lauterbach GmbH, Altlaufstr.40, D-85635 Höhenkirchen-Siegertsbrunn, Germany  Impressum
The information presented is intended to give overview information only.
Changes and technical enhancements or modifications can be made without notice. Report Errors
Last generated/modified: 05-Dec-2016